| 释义 |
walking "1" and "0" 走步“1”和“0” A method of testing semiconductor memory by writing a “1” or “0” step by step into succeeding locations and reading out the content of every location to check correctness of writing and reading. 半导体存储器的一种测试方法,通过把“1”或“0”逐步写入其下一地址并读出所有地 址的内容来检查读、写的正确性。 |