| 释义 |
computer-operated memory test system
计算机控制存储器测试系统
Computer-operated test systems designed to test semiconductor memories. They combine the reliability and productivity necessary for production testing with the versatility required for device characterization and evaluation.
在计算机的控制下对半导体存储器进行测试的系统,既能满足产品测试的可靠性与生产率,又有 适应器件特性、设备更新演变的灵活性。 |